Park NX12 AFM

A modular platform for shared user facilities

• Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities
• Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
• Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration

Park NX12 an easy-to-use platform with all the tools you need, including:

• Versatile and easy-to-use electrochemistry cells
• Environmental control options for inert gas and humidity
• Inverted optical microscope (IOM)
• Bi-potentiostat compatibility

Dedicated for various electrochemical applications:

• Scanning Electrochemical Microscopy (SECM)
• Scanning Electrochemical Cell Microscopy (SECCM)
• Electrochemical Atomic Force Microscopy (EC-AFM) and Electrochemical Scanning Tunneling Microscope (EC-STM)

Easy Optical Access with motorized focus stage

The system allows for top, side, and bottom optical access to the probe from various angles during measurements. This broad optical access combined with the device’s modular design also allows for the addition of optical or nano-optical add-ons.

Multiple Applications

• PinPoint™ in-liquid and nanomechanical mapping
• Inverted optical microscopy to locate transparent samples
• SICM for imaging ultra-soft samples

SmartScan™ makes scanning fast and simple

The Park NX12 is equipped with Park’s SmartScan™ OS, making it one of the easiest to use AFMs in the market. With an intuitive but extremely powerful interface, even untrained users can quickly scan a sample without supervision.