MATERIALS

Nanomechanical Testers

Nanomechanical Testers

We offer a complete portfolio of high-throughput nanomechanical testers for material characterization and process control needs. With flexible add-on and upgrade options, our nanoindenter systems can be used for a wide range of nano-scale measurements,...
Optical Profilers

Optical Profilers

A complete range of surface metrology capabilities to meet the needs of the engineering and research communities. The profilers take measurement to the next level, starting with step height, texture and stress analysis. ZETA-20 Optical Profiler...
Spectroscopic Ellipsometers

Spectroscopic Ellipsometers

Spectroscopic Ellipsometers UNECS series is a kind of spectroscopic ellipsometers to measure the refractive index and thickness of the thin film quickly and accurately. It adopts an unique measurement method, and realizes the compact size and high-speed...
AFM in SEM

AFM in SEM

AFM in SEM Producer: NenoVision, Czech Republic LiteScope™- Scanning Probe Microscope designed for easy integration into the Electron Microscopes. The combination of complementary SPM and SEM techniques enables to use the advantages of both c...
XE15 AFM

XE15 AFM

Power and versatility, brilliantly combined. For samples up to 150 mm x 150 mm. Ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers. Its reasonable...
Park NX 10 AFM

Park NX 10 AFM

  The quickest path to innovative research. Adaptable to any project. The most extensive range of SPM modes. NX series allows it to be easily tailored to the needs of any scanning probe microscopy project. Park NX10 produces...
Park NX12 AFM

Park NX12 AFM

The most versatile AFM for Analytical Chemistry and the perfect platform for fundamental electrochemistry. Park NX12 couples the versatility and accuracy of Park’s AFM with a sample stage for inverted optical microscopy. This enables t...
Park NX-HiVAC AFM

Park NX-HiVAC AFM

Park NX-HiVAC AFM - High vacuum scanning for failure analysis applications Park NX-Hivac enables materials scientific research that requires high accuracy and high resolution measurements in a vacuum environment free from oxygen and other agents. ...
Park XE7 AFM

Park XE7 AFM

The economical choice for innovative research. Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Park XE7 the most affordable as a research grade AFM, it is also the most economical...
NX20-300mm AFM

NX20-300mm AFM

The leading automated nanometrology tool for 300 mm wafer measurement and analysis Park NX20 300mm is the industry's first large sample AFM that supports a full motorized traveling range of 300 mm x 300 mm. The entire 300 mm wafer area can be analyzed...
NX20 AFM

NX20 AFM

Leading nano metrology tool for failure analysis and large sample research for samples up to 200mm x 200mm Park NX20, with its reputation in the semiconductor and hard disk industry as the world’s most accurate large sample AFM. Accurate AFM Solutions f...
Contact Profilers

Contact Profilers

A complete range of surface metrology capabilities to meet the needs of the engineering and research communities. The profilers take measurement to the next level, starting with step height, texture and stress analysis. Alpha-Step D-500 Stylus...