Email

contact@schaefer-tec.ro

Phone

(+40) 0733 944 144

MATERIALS

Nanomechanical Testers

We offer a complete portfolio of high-throughput nanomechanical testers for material characterization and process control needs.

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Nanomechanical Testers

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Optical Profilers

A complete range of surface metrology capabilities to meet the needs of the engineering and research communities.

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Optical Profilers

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Spectroscopic Ellipsometers

Spectroscopic Ellipsometers UNECS series is a kind of spectroscopic ellipsometers to measure the refractive index and thickness of the thin film quickly and accurately.

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Spectroscopic Ellipsometers

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AFM in SEM

LiteScope™- Scanning Probe Microscope designed for easy integration into the Electron Microscopes.

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AFM in SEM

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XE15 AFM

Ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers.

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XE15 AFM

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Park NX 10 AFM

The most extensive range of SPM modes. NX series allows it to be easily tailored to the needs of any scanning probe microscopy project.

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Park NX 10 AFM

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Park NX12 AFM

The most versatile AFM for Analytical Chemistry and the perfect platform for fundamental electrochemistry.

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Park NX12 AFM

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Park NX-HiVAC AFM

Park NX-Hivac enables materials scientific research that requires high accuracy and high resolution measurements in a vacuum environment free from oxygen and other agents.

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Park NX-HiVAC AFM

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Park XE7 AFM

The economical choice for innovative research. Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford.

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Park XE7 AFM

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NX20-300mm AFM

Park NX20 300mm is the industry’s first large sample AFM that supports a full motorized traveling range of 300 mm x 300 mm.

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NX20-300mm AFM

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NX20 AFM

Leading nano metrology tool for failure analysis and large sample research for samples up to 200mm x 200mm Park NX20, with its reputation in the semiconductor and hard disk industry as the world’s most accurate large sample AFM.

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NX20 AFM

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Contact Profilers

A complete range of surface metrology capabilities to meet the needs of the engineering and research communities.

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Contact Profilers

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Digital Holographic Microscopy

Digital Holographic Microscopy offers solutions for static and dynamic 3D characterization in material science and life science applications.

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Digital Holographic Microscopy

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Vacuum Instruments and Gas Mass Flow Instruments

The g​as mass flow line of ​meters and controllers cover a broad range of flow rates from 5 sccm to 15,000 slm

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Vacuum Instruments and Gas Mass Flow Instruments

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