Spectroscopic Ellipsometers UNECS series is a kind of spectroscopic ellipsometers to measure the refractive index and thickness of the thin film quickly and accurately.
Ideal for shared labs that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers.
Park NX-Hivac enables materials scientific research that requires high accuracy and high resolution measurements in a vacuum environment free from oxygen and other agents.
The economical choice for innovative research. Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford.
Leading nano metrology tool for failure analysis and large sample research for samples up to 200mm x 200mm Park NX20, with its reputation in the semiconductor and hard disk industry as the world’s most accurate large sample AFM.
