Leading nano metrology tool for failure analysis and large sample research for samples up to 200mm x 200mm
Park NX20, with its reputation in the semiconductor and hard disk industry as the world’s most accurate large sample AFM.
Accurate AFM Solutions for FA and Research Laboratories
- Able to detect the sidewall and surface of the sample, and measure their angle.
- Surface roughness measurements for media and substrates
- High resolution electrical scan mode
QuickStep SCM – The Fastest Scanning Capacitance Microscopy
- PinPoint AFM – The Frictionless Conductive AFM
- …more related AFM modes
- Accurate and reproducible measurements
- True Non-Contact mode preserves the sharp tip end even after imaging 200 images of CrN (a very abrasive surface)
- True Sample Topography™ without piezo creep error- This produces highly accurate sample topography, no edge overshoot and no need for calibration.