AFM in SEM

AFM in SEM

Producer: NenoVision, Czech Republic

LiteScope™- Scanning Probe Microscope designed for easy integration into the Electron Microscopes. The combination of complementary SPM and SEM techniques enables to use the advantages of both commonly used microscopy techniques.

 


Advantages:
  • Unique Correlative Probe and Electron Microscopy technology (CPEM)
  • Comprehensive surface characterization – Topography, Roughness, Magnetic properties, Conductivity, Electrical properties
  • Precies tip navigation on the sample
  • Easy integration and mounting / removal in under five minutes
  • Just plug and play
  • Compatible with FIB, GIS, EDX and other accessories
About CPEM Technology

Correlative microscopy is an approach that benefits from the imaging of the same object by two different techniques. A solution which synchronizes:

  • the scanned area
  • resolution and image distortion
  • and enables to correlate both acquired SPM and SEM images in real time

CPEM allows measurement of SPM and SEM:
  • in the same place
  • at the same time
  • using the same coordination system