Producer: NenoVision, Czech Republic

LiteScope™- Scanning Probe Microscope designed for easy integration into the Electron Microscopes. The combination of complementary SPM and SEM techniques enables to use the advantages of both commonly used microscopy techniques.


  • Unique Correlative Probe and Electron Microscopy technology (CPEM)
  • Comprehensive surface characterization – Topography, Roughness, Magnetic properties, Conductivity, Electrical properties
  • Precies tip navigation on the sample
  • Easy integration and mounting / removal in under five minutes
  • Just plug and play
  • Compatible with FIB, GIS, EDX and other accessories
About CPEM Technology

Correlative microscopy is an approach that benefits from the imaging of the same object by two different techniques. A solution which synchronizes:

  • the scanned area
  • resolution and image distortion
  • and enables to correlate both acquired SPM and SEM images in real time

CPEM allows measurement of SPM and SEM:
  • in the same place
  • at the same time
  • using the same coordination system