Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution.
- Easy Tip and Sample Exchange
The cantilever is ready for scanning without the need for any tricky laser beam alignment by using pre-aligned cantilevers mounted on to the cantilever tip holder. - Lightning Fast Automatic Tip Approach
Our automatic tip to sample approach requires no user intervention and engages in just 10 seconds after loading the cantilever. - High Speed Z Scanner
- The Z detector is the key technological advance of the new NX-series AFM. The noise level is low enough for Z-detector to be used as the default topography signal.
- Motorized XY Sample Stage
- Step Scan Automation
- Accurate AFM Scan by True Non-Contact™ Mode
- SmartScan™
- High Speed Digital Electronics
