LiteScope™- Scanning Probe Microscope designed for easy integration into the Electron Microscopes. The combination of complementary SPM and SEM techniques enables to use the advantages of both commonly used microscopy techniques.
Advantages:
About CPEM Technology
Correlative microscopy is an approach that benefits from the imaging of the same object by two different techniques. A solution which synchronizes:
CPEM allows measurement of SPM and SEM:
