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contact@schaefer-tec.ro

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Nanomechanical Testers

Nanomechanical Testers

We offer a complete portfolio of high-throughput nanomechanical testers for material characterization and process control needs. With flexible add-on and upgrade options, our nanoindenter systems can be used for a wide range of nano-scale measurements, including hardness, modulus and adhesion.

Producer: Kla Tencor, USA »

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G200 nanoindenter®

Designed for nanoscale measurements during characterization and development of a wide range of materials

  • High dynamic range in force and displacement
  • Modular options, as:
    – loading capability: of 500mN or 30mN
    – Continuous Stiffness Measurement (CSM) technique
    – Express Test option- fast way to conduct high-precision nanomechanical tests
    – Laser-heated tip and stage
    – Lateral Force Measurement (LFM)
    – High Load option (up to 10N)
    – High-temperature nanoindentation measurements
    – Dynamic testing
  • Real-time experimental control, easy test protocol development and precise thermal drift compensation
  • Intuitive interface for quick test setup; testing parameters can be changed with just a few mouse clicks
  • Award-winning, high-speed Express Test option to measure hardness and modulus
  • Versatile imaging capabilities, survey scanning, and streamlined test method development for rapid results
  • Simple determination of indenter area function and load frame stiffness

Applications:
  • High-speed hardness and modulus measurement
  • Interfacial adhesion measurement
  • Fracture toughness measurement
  • Viscoelastic properties measurement
  • Scanning probe microscopy (3D imaging)
  • Wear and scratch resistance
  • High-temperature nanoindentation

iNano® nanoindenter

Makes measuring thin films, coatings and small volumes of material easy

  • InForce 50 actuator for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
  • Unique software-integrated tip-calibration system for fast, accurate tip calibration
  • InQuest high-speed controller electronics with 100kHz data acquisition rate and 20µs time constant
  • XY motion system with easy mounting magnetic sample holder
  • Integrated microscope with digital zoom for precise indentation targeting
  • ISO 14577 and standardized test methods
  • InView software package with RunTest, ReviewData, InFocus reporting, InView University online training and InView mobile application

Applications:
  • Hardness and modulus measurements (Oliver-Pharr)
  • High speed material property maps
  • ISO 14577 hardness testing
  • Polymer tan delta, storage and loss modulus
  • High Temperature Nanoindentation Testing

iMicro nanoindenter

Makes measuring hard coatings, thin films, and small volumes of material easy

  • InForce 1000 actuator for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
  • Optional InForce 50 actuator provide maximum 50mN normal force for measuring soft materials, optional Gemini 2D force transducer for two-axis dynamic measurement. Unique software-integrated tip-calibration system for fast, accurate tip calibration
  • InQuest high-speed controller electronics with 100kHz data acquisition rate and 20µs time constant
  • XY motion system with easy mounting magnetic sample holder
  • High stiffness gantry with integrated vibration isolation
  • Integrated microscope with digital zoom for precise indentation targeting
  • ISO 14577 and standardized test methods
  • InView software package with RunTest, ReviewData, InFocus reporting, InView University online training and InView mobile application

Applications:
  • Hardness and modulus measurements (Oliver-Pharr)
  • High speed material property maps
  • ISO 14577 hardness testing
  • Polymer tan delta, storage and loss modulus
  • Quantitative scratch and wear testing
  • High Temperature Nanoindentation Testing

NanoFlip nanoindenter

Measures hardness, modulus, yield strength, stiffness and other nanomechanical tests with high accuracy and precision under both vacuum and ambient conditions

  • InForce 50 actuator for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
  • InQuest high-speed controller electronics with 100kHz data acquisition rate and 20µs time constant
  • XYZ motion system for sample targeting
  • SEM video capture for synchronized SEM images with test data
  • Unique software-integrated tip-calibration system for fast, accurate tip calibration
  • InView control and data review software with Windows ®10 compatibility and method developer for user-designed experiments

Applications:
  • InForce 50 actuator for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
  • InQuest high-speed controller electronics with 100kHz data acquisition rate and 20µs time constant
  • XYZ motion system for sample targeting
  • SEM video capture for synchronized SEM images with test data
  • Unique software-integrated tip-calibration system for fast, accurate tip calibration
    InView control and data review software with Windows ®10 compatibility and method developer for user-designed experiments

InSEM HT (high temperature) nanoindenter

Allows independent tip and sample heating in a vacuum environment, and is compatible with many SEM/FIB chambers or standalone vacuum chambers

  • InForce 50 actuator with tip heating for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
  • Sample heating up to 800 °C with 10mm sample-size and vacuum-compatible sample mounting system
  • InQuest high speed controller electronics with 100kHz data acquisition rate and 20µs time constant
  • XYZ motion system for sample targeting
  • SEM video capture for synchronized SEM images with test data
  • Unique software-integrated tip-calibration system for fast, accurate tip calibration
  • InView control and data review software with Windows ® 10 compatibility and method developer for user-designed experiments

Applications:
  • High temperature testing
  • Hardness and modulus measurements (Oliver-Pharr)
  • Continuous stiffness measurement
  • High speed material property maps
  • Creep measurement
  • Strain rate sensitivity

MATERIALS

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Schaefer-Tec distributes in Europe since 1963 rigorously selected SME suppliers of characterization technologies for Nano-Sciences.

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